Phantom Force Induced by Tunneling Current: A Characterization on Si(111)

A. J. Weymouth, T. Wutscher, J. Welker, T. Hofmann, and F. J. Giessibl
Phys. Rev. Lett. 106, 226801 – Published 1 June 2011

Abstract

Simultaneous measurements of tunneling current and atomic forces provide complementary atomic-scale data of the electronic and structural properties of surfaces and adsorbates. With these data, we characterize a strong impact of the tunneling current on the measured force on samples with limited conductivity. The effect is a lowering of the effective gap voltage through sample resistance which in turn lowers the electrostatic attraction, resulting in an apparently repulsive force. This effect is expected to occur on other low-conductance samples, such as adsorbed molecules, and to strongly affect Kelvin probe measurements when tunneling occurs.

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  • Received 8 March 2011

DOI:https://doi.org/10.1103/PhysRevLett.106.226801

© 2011 American Physical Society

Authors & Affiliations

A. J. Weymouth, T. Wutscher, J. Welker, T. Hofmann, and F. J. Giessibl

  • Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany

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Issue

Vol. 106, Iss. 22 — 3 June 2011

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