Abstract
Achieving comprehensive information on thin film lattice dynamics so far has eluded well established spectroscopic techniques. We demonstrate here the novel application of grazing incidence inelastic x-ray scattering combined with ab initio calculations to determine the complete elastic stiffness tensor, the acoustic and low-energy optic phonon dispersion relations of thin wurtzite indium nitride films. Indium nitride is an especially relevant example, due to the technological interest for optoelectronic and solar cell applications in combination with other group III nitrides.
- Received 24 November 2010
DOI:https://doi.org/10.1103/PhysRevLett.106.205501
© 2011 American Physical Society
Synopsis
X rays scratch the surface
Published 19 May 2011
A new x-ray scattering technique successfully probes the elastic properties of thin semiconductor films.
See more in Physics