High-Precision Metrology of Highly Charged Ions via Relativistic Resonance Fluorescence

O. Postavaru, Z. Harman, and C. H. Keitel
Phys. Rev. Lett. 106, 033001 – Published 18 January 2011

Abstract

Resonance fluorescence of laser-driven highly charged ions is investigated with regard to precisely measuring atomic properties. For this purpose an ab initio approach based on the Dirac equation is employed that allows for studying relativistic ions. These systems provide a sensitive means to test correlated relativistic dynamics, quantum electrodynamic phenomena and nuclear effects by applying x-ray lasers. We show how the narrowing of sidebands in the x-ray fluorescence spectrum by interference due to an additional optical driving can be exploited to determine atomic dipole or multipole moments to unprecedented accuracy.

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  • Received 2 July 2010

DOI:https://doi.org/10.1103/PhysRevLett.106.033001

© 2011 American Physical Society

Authors & Affiliations

O. Postavaru, Z. Harman, and C. H. Keitel

  • Max Planck Institute for Nuclear Physics, Saupfercheckweg 1, 69117 Heidelberg, Germany
  • ExtreMe Matter Institute EMMI, Planckstrasse 1, 64291 Darmstadt, Germany

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Issue

Vol. 106, Iss. 3 — 21 January 2011

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