Suppression of Intermixing in Strain-Relaxed Epitaxial Layers

T. Leontiou, J. Tersoff, and P. C. Kelires
Phys. Rev. Lett. 105, 236104 – Published 3 December 2010

Abstract

Misfit strain plays a crucial role in semiconductor heteroepitaxy, driving alloy intermixing or the introduction of dislocations. Here we predict a strong coupling between these two modes of strain relaxation, with unexpected consequences. Specifically, strain relaxation by dislocations can suppress intermixing between the heterolayer and the substrate. Monte Carlo simulations and continuum modeling show that the suppression, though not absolute, can be surprisingly large, even at high temperatures. The effect is strongest for a large misfit (e.g., InAs on GaAs) or for thin substrates (e.g., Ge on silicon on insulator).

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  • Received 23 August 2010

DOI:https://doi.org/10.1103/PhysRevLett.105.236104

The American Physical Society

Authors & Affiliations

T. Leontiou1, J. Tersoff2, and P. C. Kelires1

  • 1Department of Mechanical & Materials Science Engineering, Cyprus University of Technology, P.O. Box 50329, 3036 Limassol, Cyprus
  • 2IBM T. J. Watson Research Center, Yorktown Heights, New York 10598, USA

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Issue

Vol. 105, Iss. 23 — 3 December 2010

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