On-Off Intermittency and Criticality in Early Stage Electromigration

Eric Dalton, Ian Clancy, David Corcoran, Arousian Arshak, and George Gooberman
Phys. Rev. Lett. 104, 214101 – Published 27 May 2010

Abstract

We have studied here using high resolution resistance measurements the time and statistical behavior of abrupt resistance changes in a thin metal aluminum film undergoing electromigration. We reveal for the first time that early stage electromigration exhibits on-off intermittency. The intermittent resistance fluctuations are also shown to be scale invariant, an effect seen in the fluctuations of several physical systems including earthquakes, superconductor dynamics and stock markets. Finite size scaling of the resistance fluctuations demonstrates that they originate near a critical point.

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  • Received 19 January 2010

DOI:https://doi.org/10.1103/PhysRevLett.104.214101

©2010 American Physical Society

Authors & Affiliations

Eric Dalton

  • CTVR-Stokes Institute, University of Limerick, Ireland

Ian Clancy, David Corcoran*, Arousian Arshak, and George Gooberman

  • Department of Physics, University of Limerick, Ireland

  • *david.corcoran@ul.ie

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Vol. 104, Iss. 21 — 28 May 2010

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