Parallel Electron-Hole Bilayer Conductivity from Electronic Interface Reconstruction

R. Pentcheva, M. Huijben, K. Otte, W. E. Pickett, J. E. Kleibeuker, J. Huijben, H. Boschker, D. Kockmann, W. Siemons, G. Koster, H. J. W. Zandvliet, G. Rijnders, D. H. A. Blank, H. Hilgenkamp, and A. Brinkman
Phys. Rev. Lett. 104, 166804 – Published 23 April 2010
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Abstract

The perovskite SrTiO3LaAlO3 structure has advanced to a model system to investigate the rich electronic phenomena arising at polar oxide interfaces. Using first principles calculations and transport measurements we demonstrate that an additional SrTiO3 capping layer prevents atomic reconstruction at the LaAlO3 surface and triggers the electronic reconstruction at a significantly lower LaAlO3 film thickness than for the uncapped systems. Combined theoretical and experimental evidence (from magnetotransport and ultraviolet photoelectron spectroscopy) suggests two spatially separated sheets with electron and hole carriers, that are as close as 1 nm.

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  • Received 22 December 2009

DOI:https://doi.org/10.1103/PhysRevLett.104.166804

©2010 American Physical Society

Authors & Affiliations

R. Pentcheva1, M. Huijben2, K. Otte1, W. E. Pickett3, J. E. Kleibeuker2, J. Huijben2, H. Boschker2, D. Kockmann2, W. Siemons4, G. Koster2, H. J. W. Zandvliet2, G. Rijnders2, D. H. A. Blank2, H. Hilgenkamp2, and A. Brinkman2

  • 1Department of Earth and Environmental Sciences, University of Munich, D-80333 Munich, Germany
  • 2MESA+ Institute for Nanotechnology, University of Twente, 7500 AE Enschede, The Netherlands
  • 3Department of Physics, University of California, Davis, California 95616, USA
  • 4Department of Physics, University of California, Berkeley, California 94720, USA

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Issue

Vol. 104, Iss. 16 — 23 April 2010

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