Systematic Achievement of Improved Atomic-Scale Contrast via Bimodal Dynamic Force Microscopy

Shigeki Kawai, Thilo Glatzel, Sascha Koch, Bartosz Such, Alexis Baratoff, and Ernst Meyer
Phys. Rev. Lett. 103, 220801 – Published 23 November 2009
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Abstract

Judiciously matched experiments, calculations, and theory demonstrate that a higher sensitivity to short-range interactions and, consequently, improved resolution on the atomic scale can be achieved by bimodal noncontact dynamic force microscopy. The combination of sub-Ångström tip oscillation at the second flexural resonance of a commercially available silicon cantilever with the commonly used large amplitude oscillation at the fundamental resonance frequency enables this performance improvement while avoiding potentially damaging jump-to-contact instabilities.

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  • Received 10 December 2008

DOI:https://doi.org/10.1103/PhysRevLett.103.220801

©2009 American Physical Society

Authors & Affiliations

Shigeki Kawai*, Thilo Glatzel, Sascha Koch, Bartosz Such, Alexis Baratoff, and Ernst Meyer

  • Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland

  • *shigeki.kawai@unibas.ch

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Vol. 103, Iss. 22 — 27 November 2009

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