Abstract
We propose a method for optical nanoimaging in which the structure of a three-dimensional inhomogeneous medium may be recovered from far-field power measurements. Neither phase control of the illuminating field nor phase measurements of the scattered field are necessary. The method is based on the solution to the inverse scattering problem for a system consisting of a weakly-scattering dielectric sample and a strongly-scattering nanoparticle tip. Numerical simulations are used to illustrate the results.
- Received 20 June 2009
DOI:https://doi.org/10.1103/PhysRevLett.103.213901
©2009 American Physical Society