Abstract
Double photoionization (DPI) and ionization-excitation (IE) of and , state-prepared and aligned in a magneto-optical trap, were explored in a reaction microscope at the free-electron laser in Hamburg (FLASH). From 6 to 12 eV above threshold (, 91 eV), total as well as differential DPI cross sections were observed to critically depend on the initial state and, in particular, on the alignment of the orbital with respect to the VUV-light polarization, whereas no effect is seen for IE. The alignment sensitivity is traced back to dynamical electron correlation at threshold.
- Received 10 June 2009
DOI:https://doi.org/10.1103/PhysRevLett.103.103008
©2009 American Physical Society