Abstract
We propose an efficient scheme to simulate noncontact atomic force microscopy images by using first-principles self-consistent potential from the sample as input without explicit modeling of the atomic force microscopy tip. Our method is applied to various types of semiconductor surfaces including , , , and surfaces. We obtain good agreement with experimental results and previous theoretical studies, and our method can aid in identifying different structural models for surface reconstruction.
- Received 4 September 2008
- Publisher error corrected 5 May 2009
DOI:https://doi.org/10.1103/PhysRevLett.102.176101
©2009 American Physical Society
Corrections
5 May 2009