Scaling Theory of Magnetoresistance and Carrier Localization in Ga1xMnxAs

C. P. Moca, B. L. Sheu, N. Samarth, P. Schiffer, B. Janko, and G. Zarand
Phys. Rev. Lett. 102, 137203 – Published 1 April 2009

Abstract

We compare experimental resistivity data on Ga1xMnxAs films with theoretical calculations using a scaling theory for strongly disordered ferromagnets. The characteristic features of the temperature dependent resistivity can be quantitatively understood through this approach as originating from the close vicinity of the metal-insulator transition. However, accounting for thermal fluctuations is crucial for a quantitative description of the magnetic field induced changes in resistance. While the noninteracting scaling theory is in reasonable agreement with the data, we find clear evidence for interaction effects at low temperatures.

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  • Received 18 May 2007

DOI:https://doi.org/10.1103/PhysRevLett.102.137203

©2009 American Physical Society

Authors & Affiliations

C. P. Moca1,2, B. L. Sheu3, N. Samarth3, P. Schiffer3, B. Janko4,5, and G. Zarand1

  • 1Budapest University of Technology and Economics, H-1521 Budapest, Hungary
  • 2Department of Physics, University of Oradea, 410087 Oradea, Romania
  • 3Department of Physics and Materials Research Institute, Pennsylvania State University, University Park, Pennsylvania 16802, USA
  • 4Department of Physics, University of Notre Dame, Notre Dame, Indiana, 46556, USA
  • 5Materials Science Division, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois, 60439, USA

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Issue

Vol. 102, Iss. 13 — 3 April 2009

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