Abstract
A (001) wafer has been investigated in situ at room temperature under application of a static electric field of varying polarity by fluorescence x-ray absorption near edge structure (XANES) analysis at the Sr- and Ti- absorption edges. The XANES spectra show a clear shift of the Ti- absorption edge energy. The shift is attributed to a change of the Ti valence state in a volume invoked by diffusion of the oxygen ions and vacancies. No shift was observed for the Sr- absorption edge energy. Theoretical calculations support these findings.
- Received 8 May 2008
DOI:https://doi.org/10.1103/PhysRevLett.102.087601
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