Cleaving-Temperature Dependence of Layered-Oxide Surfaces

Y. Pennec, N. J. C. Ingle, I. S Elfimov, E. Varene, Y. Maeno, A. Damascelli, and J. V. Barth
Phys. Rev. Lett. 101, 216103 – Published 21 November 2008

Abstract

The surfaces generated by cleaving nonpolar, two-dimensional oxides are often considered to be perfect or ideal. However, single particle spectroscopies on Sr2RuO4, an archetypal nonpolar two-dimensional oxide, show significant cleavage temperature dependence. We demonstrate that this is not a consequence of the intrinsic characteristics of the surface: lattice parameters and symmetries, step heights, atom positions, or density of states. Instead, we find a marked increase in the density of defects at the mesoscopic scale with increased cleave temperature. The potential generality of these defects to oxide surfaces may have broad consequences to interfacial control and the interpretation of surface sensitive measurements.

  • Figure
  • Figure
  • Figure
  • Figure
  • Received 16 July 2008

DOI:https://doi.org/10.1103/PhysRevLett.101.216103

©2008 American Physical Society

Authors & Affiliations

Y. Pennec1, N. J. C. Ingle1,*, I. S Elfimov1, E. Varene1, Y. Maeno4, A. Damascelli1,2, and J. V. Barth1,2,3

  • 1Advanced Materials and Process Engineering Laboratory, University of British Columbia, Vancouver, BC, Canada
  • 2Department of Physics and Astronomy, University of British Columbia, Vancouver, BC, Canada
  • 3Physik Department E20, Technische Universität München, Munich, Germany
  • 4Department of Physics, Kyoto University, Kyoto 606-8502, Japan

  • *ingle@physics.ubc.ca

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 101, Iss. 21 — 21 November 2008

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×