Strong-Coupling Electrostatics in the Presence of Dielectric Inhomogeneities

Y. S. Jho, M. Kanduč, A. Naji, R. Podgornik, M. W. Kim, and P. A. Pincus
Phys. Rev. Lett. 101, 188101 – Published 29 October 2008

Abstract

We study the strong-coupling (SC) interaction between two like-charged membranes of finite thickness embedded in a medium of higher dielectric constant. A generalized SC theory is applied along with extensive Monte Carlo simulations to study the image charge effects induced by multiple dielectric discontinuities in this system. These effects lead to strong counterion crowding in the central region of the intersurface space upon increasing the solvent-membrane dielectric mismatch and change the membrane interactions from attractive to repulsive at small separations. These features agree quantitatively with the SC theory at elevated couplings or dielectric mismatch where the correlation hole around counterions is larger than the thickness of the central counterion layer.

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  • Received 12 May 2008

DOI:https://doi.org/10.1103/PhysRevLett.101.188101

©2008 American Physical Society

Authors & Affiliations

Y. S. Jho1,2, M. Kanduč3, A. Naji1,4, R. Podgornik3,5, M. W. Kim1,2, and P. A. Pincus1,2

  • 1Materials Research Laboratory, University of California, Santa Barbara, California 93106, USA
  • 2Department of Physics, Korea Advanced Institute of Science and Technology, Yuseong-Gu, Daejeon, Korea 305-701
  • 3Department of Theoretical Physics, J. Stefan Institute, SI-1000 Ljubljana, Slovenia
  • 4Department of Chemistry and Biochemistry, University of California, Santa Barbara, California 93106, USA
  • 5Department of Physics, Faculty of Mathematics and Physics, University of Ljubljana, SI-1000 Ljubljana, Slovenia

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Vol. 101, Iss. 18 — 31 October 2008

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