Single and Double Orbital Excitations Probed by Resonant Inelastic X-Ray Scattering

Filomena Forte, Luuk J. P. Ament, and Jeroen van den Brink
Phys. Rev. Lett. 101, 106406 – Published 5 September 2008

Abstract

The dispersion of the elusive elementary excitations of orbital ordered systems, orbitons, has escaped detection so far. The recent advances in resonant inelastic x-ray scattering (RIXS) techniques have made it, in principle, a powerful new probe of orbiton dynamics. We compute the detailed traces that orbitons leave in RIXS for an eg orbital ordered system, using the ultrashort core-hole lifetime expansion for RIXS. We observe that both single- and double-orbiton excitations are allowed, where the former, at lower energy, have sharper features. The rich energy- and momentum-dependent intensity variations that we observe make clear that RIXS is an ideal method to identify and map out orbiton dispersions.

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  • Received 8 July 2008

DOI:https://doi.org/10.1103/PhysRevLett.101.106406

©2008 American Physical Society

Authors & Affiliations

Filomena Forte, Luuk J. P. Ament, and Jeroen van den Brink

  • Institute-Lorentz for Theoretical Physics, Universiteit Leiden, P.O. Box 9506, 2300 RA Leiden, The Netherlands

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Issue

Vol. 101, Iss. 10 — 5 September 2008

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