• Open Access

Deep neural networks for classifying complex features in diffraction images

Julian Zimmermann, Bruno Langbehn, Riccardo Cucini, Michele Di Fraia, Paola Finetti, Aaron C. LaForge, Toshiyuki Nishiyama, Yevheniy Ovcharenko, Paolo Piseri, Oksana Plekan, Kevin C. Prince, Frank Stienkemeier, Kiyoshi Ueda, Carlo Callegari, Thomas Möller, and Daniela Rupp
Phys. Rev. E 99, 063309 – Published 19 June 2019

Abstract

Intense short-wavelength pulses from free-electron lasers and high-harmonic-generation sources enable diffractive imaging of individual nanosized objects with a single x-ray laser shot. The enormous data sets with up to several million diffraction patterns present a severe problem for data analysis because of the high dimensionality of imaging data. Feature recognition and selection is a crucial step to reduce the dimensionality. Usually, custom-made algorithms are developed at a considerable effort to approximate the particular features connected to an individual specimen, but because they face different experimental conditions, these approaches do not generalize well. On the other hand, deep neural networks are the principal instrument for today's revolution in automated image recognition, a development that has not been adapted to its full potential for data analysis in science. We recently published [Langbehn et al., Phys. Rev. Lett. 121, 255301 (2018)] the application of a deep neural network as a feature extractor for wide-angle diffraction images of helium nanodroplets. Here we present the setup, our modifications, and the training process of the deep neural network for diffraction image classification and its systematic bench marking. We find that deep neural networks significantly outperform previous attempts for sorting and classifying complex diffraction patterns and are a significant improvement for the much-needed assistance during postprocessing of large amounts of experimental coherent diffraction imaging data.

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  • Received 18 March 2019

DOI:https://doi.org/10.1103/PhysRevE.99.063309

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Statistical Physics & ThermodynamicsAtomic, Molecular & OpticalGeneral Physics

Authors & Affiliations

Julian Zimmermann1,*, Bruno Langbehn2, Riccardo Cucini3, Michele Di Fraia3,4, Paola Finetti3, Aaron C. LaForge5, Toshiyuki Nishiyama6, Yevheniy Ovcharenko2,7, Paolo Piseri8, Oksana Plekan3, Kevin C. Prince3,9, Frank Stienkemeier5, Kiyoshi Ueda10, Carlo Callegari3,4, Thomas Möller2, and Daniela Rupp1

  • 1Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, 12489 Berlin, Germany
  • 2Institut für Optik und Atomare Physik, Technische Universität Berlin, 10623 Berlin, Germany
  • 3Elettra-Sincrotrone Trieste S.C.p.A., 34149 Trieste, Italy
  • 4ISM-CNR, Istituto di Struttura della Materia, LD2 Unit, 34149 Trieste, Italy
  • 5Institute of Physics, University of Freiburg, 79104 Freiburg, Germany
  • 6Division of Physics and Astronomy, Graduate School of Science, Kyoto University, Kyoto 606-8502, Japan
  • 7European XFEL GmbH, 22869 Schenefeld, Germany
  • 8CIMAINA and Dipartimento di Fisica, University degli Studi di Milano, 20133 Milano, Italy
  • 9Department of Chemistry and Biotechnology, Swinburne University of Technology, Victoria 3122, Australia
  • 10Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan

  • *julian.zimmermann@mbi-berlin.de

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Vol. 99, Iss. 6 — June 2019

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