Chase-and-run dynamics in cell motility and the molecular rupture of interacting active elastic dimers

David Mayett, Nicholas Bitten, Moumita Das, and J. M. Schwarz
Phys. Rev. E 96, 032407 – Published 11 September 2017

Abstract

Cell migration in morphogenesis and cancer metastasis typically involves interplay between different cell types. We construct and study a minimal, one-dimensional model composed of two different motile cells with each cell represented as an active elastic dimer. The interaction between the two cells via cadherins is modeled as a spring that can rupture beyond a threshold force as it undergoes dynamic loading from the interacting motile cells. We obtain a phase diagram consisting of chase-and-run dynamics and clumping dynamics as a function of the stiffness of the interaction spring and the threshold force and, therefore, posit that active rupture, or rupture via active forces, is a mechanosensitive means to regulate dynamics between cells. Since the parameters in the model differentiate between N- and E-cadherins, we make predictions for the interactions between a placodelike cell and a neural crestlike cell in a microchannel as well as discuss how our results inform chase-and-run dynamics found in a group of placode cells interacting with a group of neural crest cells. In particular, an argument was made in the latter case that the feedback between cadherins and cell-substrate interaction via integrins was necessary to obtain the chase-and-run behavior. Based on our two-cell results, we argue that this feedback accentuates, but is not necessary for, the chase-and-run behavior.

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  • Received 29 December 2016
  • Revised 11 August 2017

DOI:https://doi.org/10.1103/PhysRevE.96.032407

©2017 American Physical Society

Physics Subject Headings (PhySH)

Physics of Living Systems

Authors & Affiliations

David Mayett1, Nicholas Bitten2, Moumita Das2,*, and J. M. Schwarz1,†

  • 1Department of Physics, Syracuse University, Syracuse, New York 13244, USA
  • 2School of Physics and Astronomy, Rochester Institute of Technology, Rochester, New York 14623, USA

  • *modsps@rit.edu
  • jmschw02@syr.edu

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Issue

Vol. 96, Iss. 3 — September 2017

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