Intermittency-induced criticality in a resistor-inductor-diode circuit

Stelios M. Potirakis, Yiannis Contoyiannis, Fotios K. Diakonos, and Michael P. Hanias
Phys. Rev. E 95, 042206 – Published 12 April 2017

Abstract

The current fluctuations of a driven resistor-inductor-diode circuit are investigated here looking for signatures of critical behavior monitored by the driving frequency. The experimentally obtained time series of the voltage drop across the resistor (as directly proportional to the current flowing through the circuit) were analyzed by means of the method of critical fluctuations in analogy to thermal critical systems. Intermittent criticality was revealed for a critical frequency band signifying the transition between the normal rectifier phase in the low frequencies and a full-wave conducting, capacitorlike phase in the high frequencies. The transition possesses critical characteristics with a characteristic exponent pl=1.65. A fractal analysis in terms of the rescale range (R/RSS) and detrended fluctuation analysis methods yielded results fully compatible with the critical dynamics analysis. Suggestions for the interpretation of the observed behavior in terms of pn junction operation are discussed.

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  • Received 31 October 2016
  • Revised 13 March 2017

DOI:https://doi.org/10.1103/PhysRevE.95.042206

©2017 American Physical Society

Physics Subject Headings (PhySH)

Statistical Physics & Thermodynamics

Authors & Affiliations

Stelios M. Potirakis1,*, Yiannis Contoyiannis1,†, Fotios K. Diakonos2,‡, and Michael P. Hanias2,§

  • 1Department of Electronics Engineering, Piraeus University of Applied Sciences (TEI Piraeus), 250 Thivon and P. Ralli, Aigaleo, Athens GR-12244, Greece
  • 2Department of Physics, University of Athens, GR-15771 Athens, Greece

  • *Corresponding author: Department of Electronics Engineering, Piraeus University of Applied Sciences (TEI of Piraeus), 250 Thivon & P. Ralli, GR-12244 Aigaleo–Athens, Greece; spoti@puas.gr
  • yconto@yahoo.gr
  • fdiakono@phys.uoa.gr
  • §mhanias@gmail.com

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Issue

Vol. 95, Iss. 4 — April 2017

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