Analysis of etching at a solid-solid interface

Washington S. Alves, Evandro A. Rodrigues, Henrique A. Fernandes, Bernardo A. Mello, Fernando A. Oliveira, and Ismael V. L. Costa
Phys. Rev. E 94, 042119 – Published 17 October 2016

Abstract

We present a method to derive an analytical expression for the roughness of an eroded surface whose dynamics are ruled by cellular automaton. Starting from the automaton, we obtain the time evolution of the height average and height variance (roughness). We apply this method to the etching model in 1+1 dimensions, and then we obtain the roughness exponent. Using this in conjunction with the Galilean invariance we obtain the other exponents, which perfectly match the numerical results obtained from simulations. These exponents are exact, and they are the same as those exhibited by the Kardar-Parisi-Zhang (KPZ) model for this dimension. Therefore, our results provide proof for the conjecture that the etching and KPZ models belong to the same universality class. Moreover, the method is general, and it can be applied to other cellular automata models.

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  • Received 2 May 2016
  • Revised 13 September 2016

DOI:https://doi.org/10.1103/PhysRevE.94.042119

©2016 American Physical Society

Physics Subject Headings (PhySH)

Statistical Physics & Thermodynamics

Authors & Affiliations

Washington S. Alves1,2,*, Evandro A. Rodrigues2, Henrique A. Fernandes3, Bernardo A. Mello4,†, Fernando A. Oliveira2,5,‡, and Ismael V. L. Costa1,§

  • 1Graduate Program in Material Science, Faculdade UnB Planaltina, Universidade de Brasília, CEP 73300-000, Planaltina, DF, Brazil
  • 2Instituto de Física, Universidade de Brasília, CP 04513, CEP 70919-970, Brasília, DF, Brazil
  • 3Universidade Federal de Goiás, Campus Jataí, Br 364, Km 192, 3800, Parque Industrial, CEP 75801-615, Jataí, Goiás, Brazil
  • 4IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, USA
  • 5Korea Institute for Advanced Study, Seoul 130722, South Korea

  • *wsalves@hotmail.com
  • bernardo@fis.unb.br
  • faooliveira@gmail.com
  • §ismaelcosta@gmail.com

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Issue

Vol. 94, Iss. 4 — October 2016

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