Experimental observation of multistability and dynamic attractors in silicon central pattern generators

Le Zhao and Alain Nogaret
Phys. Rev. E 92, 052910 – Published 16 November 2015

Abstract

We report on the multistability of chaotic networks of silicon neurons and demonstrate how spatiotemporal sequences of voltage oscillations are selected with timed current stimuli. A three neuron central pattern generator was built by interconnecting Hodgkin-Huxley neurons with mutually inhibitory links mimicking gap junctions. By systematically varying the timing of current stimuli applied to individual neurons, we generate the phase lag maps of neuronal oscillators and study their dependence on the network connectivity. We identify up to six attractors consisting of triphasic sequences of unevenly spaced pulses propagating clockwise and anticlockwise. While confirming theoretical predictions, our experiments reveal more complex oscillatory patterns shaped by the ratio of the pulse width to the oscillation period. Our work contributes to validating the command neuron hypothesis.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
2 More
  • Received 13 April 2015

DOI:https://doi.org/10.1103/PhysRevE.92.052910

©2015 American Physical Society

Authors & Affiliations

Le Zhao* and Alain Nogaret

  • Department of Physics, University of Bath, Bath BA2 7AY, United Kingdom

  • *Present address: Institute of Biomedical Engineering, School of Control Science and Engineering, Shandong University, Shandong 250061, People's Republic of China.
  • Corresponding author: A.R.Nogaret@bath.ac.uk

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 92, Iss. 5 — November 2015

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review E

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×