Significance of electrically induced shear stress in drainage of thin aqueous films

Christiaan Ketelaar and Vladimir S. Ajaev
Phys. Rev. E 91, 052403 – Published 19 May 2015

Abstract

We develop a novel model of drainage of microscale thin aqueous film separating a gas bubble and a solid wall. In contrast to previous studies, the electrostatic effects are accounted for not only in the normal but also in the shear stress balance at the liquid-gas interface. We show that the action of the tangential component of the electric field leads to potentially strong spatially variable shear stress at the deforming charged interface. This previously overlooked effect turns out to be essential for correctly estimating the long-time drainage rates. Comparison of time-dependent fluid interface shapes predicted by our model with the experimental data is discussed.

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  • Received 28 July 2014
  • Revised 20 March 2015

DOI:https://doi.org/10.1103/PhysRevE.91.052403

©2015 American Physical Society

Authors & Affiliations

Christiaan Ketelaar

  • Department of Mathematical Sciences, University of Delaware, Newark, Delaware 19716, USA

Vladimir S. Ajaev

  • Department of Mathematics, Southern Methodist University, Dallas, Texas 75275, USA, and Institute of Power Engineering, National Research Tomsk Polytechnic University, Tomsk 634050, Russia

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Vol. 91, Iss. 5 — May 2015

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