Ab initio calculation of shocked xenon reflectivity

G. Norman, I. Saitov, V. Stegailov, and P. Zhilyaev
Phys. Rev. E 91, 023105 – Published 23 February 2015
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Abstract

Reflectivity of shocked compressed xenon plasma is calculated within the framework of the density functional theory approach. Dependencies on the frequency of incident radiation and on the plasma density are analyzed. The Fresnel formula for the reflectivity is used. The longitudinal expression in the long-wavelength limit is applied for the calculation of the imaginary part of the dielectric function. The real part of the dielectric function is calculated by means of the Kramers-Kronig transformation. The results are compared with experimental data. The approach for the calculation of plasma frequency is developed.

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  • Received 21 June 2014

DOI:https://doi.org/10.1103/PhysRevE.91.023105

©2015 American Physical Society

Authors & Affiliations

G. Norman1,2, I. Saitov1,*, V. Stegailov1,2,3, and P. Zhilyaev1,2

  • 1Joint Institute for High Temperatures of RAS, Izhorskaya st. 13 Bld. 2, Moscow 125412, Russia
  • 2Moscow Institute of Physics and Technology (State University), Institutskiy per. 9, Dolgoprudny, Moscow Region 141700, Russia
  • 3National Research University Higher School of Economics, Myasnitskaya st. 20, Moscow 101000, Russia

  • *saitovilnur@gmail.com

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Issue

Vol. 91, Iss. 2 — February 2015

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