Loop-erased random walk on a percolation cluster is compatible with Schramm-Loewner evolution

E. Daryaei
Phys. Rev. E 90, 022129 – Published 25 August 2014

Abstract

We study the scaling limit of a planar loop-erased random walk (LERW) on the percolation cluster, with occupation probability ppc. We numerically demonstrate that the scaling limit of planar LERWp curves, for all p>pc, can be described by Schramm-Loewner evolution (SLE) with a single parameter κ that is close to the normal LERW in a Euclidean lattice. However, our results reveal that the LERW on critical incipient percolation clusters is compatible with SLE, but with another diffusivity coefficient κ. Several geometrical tests are applied to ascertain this. All calculations are consistent with SLEκ, where κ=1.732±0.016. This value of the diffusivity coefficient is outside the well-known duality range 2κ8. We also investigate how the winding angle of the LERWp crosses over from Euclidean to fractal geometry by gradually decreasing the value of the parameter p from 1 to pc. For finite systems, two crossover exponents and a scaling relation can be derived. This finding should, to some degree, help us understand and predict the existence of conformal invariance in disordered and fractal landscapes.

  • Figure
  • Figure
  • Figure
  • Figure
  • Received 2 June 2014

DOI:https://doi.org/10.1103/PhysRevE.90.022129

©2014 American Physical Society

Authors & Affiliations

E. Daryaei*

  • Department of Physics, Faculty of Basic Sciences, University of Neyshabur, P.O. Box 91136-899, Neyshabur, Iran

  • *edaryayi@gmail.com

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 90, Iss. 2 — August 2014

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review E

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×