Dewetting of evaporating thin films over nanometer-scale topographies

A. M. Akbarzadeh, A. Moosavi, and A. Moghimi Kheirabadi
Phys. Rev. E 90, 012409 – Published 31 July 2014

Abstract

A lubrication model is used to study dewetting of an evaporating thin film layer over a solid substrate with a nanometer-scale topography. The effects of the geometry of the topography, the contact angle, the film thickness, and the slippage on the dewetting have been studied. Our results reveal that the evaporation enhances the dewetting process and reduces the depinning time over the topography. Also it is shown that the depinning time is inversely proportional to the slippage and increasing the contact angle may considerably reduce the depinning time, while the film thickness increases the depinning time.

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  • Received 19 March 2014
  • Revised 2 June 2014

DOI:https://doi.org/10.1103/PhysRevE.90.012409

©2014 American Physical Society

Authors & Affiliations

A. M. Akbarzadeh, A. Moosavi*, and A. Moghimi Kheirabadi

  • Department of Mechanical Engineering, Sharif University of Technology, Azadi Avenue, P.O. Box 11365-9567, Tehran, Iran

  • *moosavi@sharif.edu

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Vol. 90, Iss. 1 — July 2014

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