Experimental examination of the effect of short ray trajectories in two-port wave-chaotic scattering systems

Jen-Hao Yeh, James A. Hart, Elliott Bradshaw, Thomas M. Antonsen, Edward Ott, and Steven M. Anlage
Phys. Rev. E 82, 041114 – Published 14 October 2010

Abstract

Predicting the statistics of realistic wave-chaotic scattering systems requires, in addition to random matrix theory, introduction of system-specific information. This paper investigates experimentally one aspect of system-specific behavior, namely, the effects of short ray trajectories in wave-chaotic systems open to outside scattering channels. In particular, we consider ray trajectories of limited length that enter a scattering region through a channel (port) and subsequently exit through a channel (port). We show that a suitably averaged value of the impedance can be computed from these trajectories and that this can improve the ability to describe the statistical properties of the scattering systems. We illustrate and test these points through experiments on a realistic two-port microwave scattering billiard.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
2 More
  • Received 15 June 2010

DOI:https://doi.org/10.1103/PhysRevE.82.041114

©2010 American Physical Society

Authors & Affiliations

Jen-Hao Yeh1, James A. Hart1,2, Elliott Bradshaw2, Thomas M. Antonsen1,2, Edward Ott1,2, and Steven M. Anlage1,2

  • 1Department of Electrical and Computer Engineering, University of Maryland, College Park, Maryland 20742-3285, USA
  • 2Physics Department, University of Maryland, College Park, Maryland 20742-4111, USA

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 82, Iss. 4 — October 2010

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review E

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×