• Rapid Communication

X-ray diffraction study of ferroelectric and antiferroelectric liquid crystal mixtures exhibiting de Vries SmA-SmC transitions

U. Manna, R. M. Richardson, Atsuo Fukuda, and J. K. Vij
Phys. Rev. E 81, 050701(R) – Published 28 May 2010

Abstract

In this Rapid Communication, results on smectic layer thickness, using synchrotron radiation x-ray diffraction, for different mixtures of ferroelectric and antiferroelectric liquid crystals are given. We find that with an increased ferroelectric component in the mixtures, the layer shrinkage at the de Vries SmA-SmC transition increases. This observation can be used to explain our previously observed behaviors [U. Manna, J.-K. Song, Yu. P. Panarin, A. Fukuda, and J. K. Vij, Phys. Rev. E 77, 041707 (2008)] that the soft-mode dielectric strength decreases, the Landau coefficient increases, and the Curie-Weiss temperature range decreases with increased ferroelectric component in the mixture exhibiting de Vries SmA-SmC transition.

  • Figure
  • Figure
  • Received 20 February 2010

DOI:https://doi.org/10.1103/PhysRevE.81.050701

©2010 American Physical Society

Authors & Affiliations

U. Manna1, R. M. Richardson2, Atsuo Fukuda1, and J. K. Vij1,*

  • 1Department of Electronic and Electrical Engineering, Trinity College, University of Dublin, Dublin 2, Ireland
  • 2H. H. Wills Physics Laboratory, University of Bristol, Tyndall Avenue, Bristol BS8 1TL, United Kingdom

  • *jvij@tcd.ie

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Vol. 81, Iss. 5 — May 2010

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