Measurement of the B lifetime using a simulation free approach for trigger bias correction

T. Aaltonen et al. (CDF Collaboration)
Phys. Rev. D 83, 032008 – Published 16 February 2011

Abstract

The collection of a large number of B-hadron decays to hadronic final states at the CDF II Detector is possible due to the presence of a trigger that selects events based on track impact parameters. However, the nature of the selection requirements of the trigger introduces a large bias in the observed proper-decay-time distribution. A lifetime measurement must correct for this bias, and the conventional approach has been to use a Monte Carlo simulation. The leading sources of systematic uncertainty in the conventional approach are due to differences between the data and the Monte Carlo simulation. In this paper, we present an analytic method for bias correction without using simulation, thereby removing any uncertainty due to the differences between data and simulation. This method is presented in the form of a measurement of the lifetime of the B using the mode BD0π. The B lifetime is measured as τB=1.663±0.023±0.015ps, where the first uncertainty is statistical and the second systematic. This new method results in a smaller systematic uncertainty in comparison to methods that use simulation to correct for the trigger bias.

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  • Received 28 April 2010

DOI:https://doi.org/10.1103/PhysRevD.83.032008

© 2011 American Physical Society

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Vol. 83, Iss. 3 — 1 February 2011

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