Measurement of B(Λc+pKπ+)

D. E. Jaffe et al. (CLEO Collaboration)
Phys. Rev. D 62, 072005 – Published 12 September 2000
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Abstract

The Λc+pKπ+ yield has been measured in a sample of two-jet continuum events containing both a charm tag (D¯) as well as an antiproton (e+eD¯p¯X), with the antiproton in the hemisphere opposite the D¯ (measurement of charge conjugate modes is implicit throughout). Under the hypothesis that such selection criteria tag e+eD¯p¯Λc+X events, the Λc+pKπ+ branching fraction can be determined by measuring the pKπ+ yield in the same hemisphere as the antiprotons in our D¯p¯X sample. Three types of D¯ charm tags are used, πsoft (from D*D0πsoft), electrons (from D¯Xeν), and fully reconstructed D0K+π or DK+ππ or Dsφπ. Combining our results obtained from the three independent charm tags, we obtain B(Λc+pKπ+)=(5.0±0.5±1.2)%.

  • Received 28 March 2000

DOI:https://doi.org/10.1103/PhysRevD.62.072005

©2000 American Physical Society

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Vol. 62, Iss. 7 — 1 October 2000

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