Measurement of the ionization of slow silicon nuclei in silicon for the calibration of a silicon dark-matter detector

G. Gerbier, E. Lesquoy, J. Rich, M. Spiro, C. Tao, D. Yvon, S. Zylberajch, P. Delbourgo, G. Haouat, C. Humeau, F. Goulding, D. Landis, N. Madden, A. Smith, J. Walton, D. O. Caldwell, B. Magnusson, M. Witherell, B. Sadoulet, and A. Da Silva
Phys. Rev. D 42, 3211 – Published 1 November 1990
PDFExport Citation

Abstract

We have measured the ionization produced in a Si(Li) detector by silicon nuclei of kinetic energies in the range 3.2-21 keV. The results are in rather good agreement with the calculations of Lindhard, Scharff, and Schiott and demonstrate the interest of Si(Li) detectors for dark-matter searches. We have also measured the intrinsic fluctuations in the ionization energy due to nucleon recoils.

  • Received 13 August 1990

DOI:https://doi.org/10.1103/PhysRevD.42.3211

©1990 American Physical Society

Authors & Affiliations

G. Gerbier, E. Lesquoy, J. Rich, M. Spiro, C. Tao, D. Yvon, and S. Zylberajch

  • Centre d'Etudes Nucléaires de Saclay, Départment de Physique des Particules Elémentaires, 91191 Gif-sur-Yvette CEDEX, France

P. Delbourgo, G. Haouat, and C. Humeau

  • Centre d'Etudes Nucléaires de Bruyères, DPN/EE, Boi̧te Postale 12, 91680 Bruyères le Chatel, France

F. Goulding, D. Landis, N. Madden, A. Smith, and J. Walton

  • Lawrence Berkeley Laboratory, Berkeley, California 94720

D. O. Caldwell, B. Magnusson, and M. Witherell

  • University of California at Santa Barbara, Santa Barbara, California 93106

B. Sadoulet and A. Da Silva

  • University of California at Berkeley, Berkeley, California 94720

References (Subscription Required)

Click to Expand
Issue

Vol. 42, Iss. 9 — 1 November 1990

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review D

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×