Low-lying dipole strength in Cr52

T. Shizuma, T. Hayakawa, I. Daito, H. Ohgaki, S. Miyamoto, and F. Minato
Phys. Rev. C 96, 044316 – Published 13 October 2017

Abstract

The low-lying dipole strength in Cr52 was measured in nuclear resonance fluorescence experiments using a quasimonochromatic, linearly polarized photon beam. The parities of the excited dipole states were determined by the intensity asymmetry of resonantly scattered γ rays with respect to the polarization plane of the incident photon beam. We observed 62 resonances at excitation energies between 7.5 and 12.1 MeV. The observed M1 and E1 strengths were compared via random-phase-approximation calculations using the Skyrme interaction. The effects of two-particle–two-hole configuration mixing and tensor force on dipole strength distributions were investigated.

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  • Received 11 April 2017
  • Revised 7 August 2017

DOI:https://doi.org/10.1103/PhysRevC.96.044316

©2017 American Physical Society

Physics Subject Headings (PhySH)

Nuclear Physics

Authors & Affiliations

T. Shizuma1, T. Hayakawa1, I. Daito2, H. Ohgaki2, S. Miyamoto3, and F. Minato4

  • 1National Institutes for Quantum and Radiological Science and Technology, Tokai, Ibaraki 319-1106, Japan
  • 2Institute of Advanced Energy, Kyoto University, Uji, Kyoto 611-0011, Japan
  • 3Laboratory of Advanced Science and Technology for Industry, University of Hyogo, Kamigori, Hyogo 678-1205, Japan
  • 4Japan Atomic Energy Agency, Tokai, Ibaraki 319-1195, Japan

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Issue

Vol. 96, Iss. 4 — October 2017

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