Abstract
The half-life of was measured by serial gamma spectrometry of the 511-keV annihilation photon following decay by emission. Data were collected every 100 seconds for 100,000–230,000 seconds within each measurement (). The 511-keV incidence rate was calculated from the 511-keV spectral peak area and count duration, corrected for detector dead time and radioactive decay. Least-squares regression analysis was used to determine the half-life of while accounting for the presence of background contaminants, notably . The result was min, which is the highest precision measurement to date and disagrees with the current Nuclear Data Sheets value by over .
- Received 5 May 2017
DOI:https://doi.org/10.1103/PhysRevC.96.014613
©2017 American Physical Society