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Two-neutrino double-β decay of Nd150 to excited final states in Sm150

M. F. Kidd, J. H. Esterline, S. W. Finch, and W. Tornow
Phys. Rev. C 90, 055501 – Published 19 November 2014

Abstract

Background: Double-β decay is a rare nuclear process in which two neutrons in the nucleus are converted to two protons with the emission of two electrons and two electron antineutrinos.

Purpose: We measured the half-life of the two-neutrino double-β decay of Nd150 to excited final states of Sm150 by detecting the deexcitation γ rays of the daughter nucleus.

Method: This study yields the first detection of the coincidence γ rays from the 01+ excited state of Sm150. These γ rays have energies of 333.97 and 406.52 keV and are emitted in coincidence through a 01+21+0gs+ transition.

Results: The enriched Nd2O3 sample consisted of 40.13 g Nd150 and was observed for 642.8 days at the Kimballton Underground Research Facility, producing 21.6 net events in the region of interest. This count rate gives a half-life of T1/2=[1.070.25+0.45(stat)±0.07(syst)]×1020 yr. The effective nuclear matrix element was found to be 0.04650.0054+0.0098. Finally, lower limits were obtained for decays to higher excited final states.

Conclusions: Our half-life measurement agrees within uncertainties with another recent measurement in which no coincidence was employed. Our nuclear matrix element calculation may have an impact on a recent neutrinoless double-β decay nuclear matrix element calculation which implies that the decay to the first excited state in Sm150 is favored over that to the ground state.

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  • Received 29 May 2014
  • Revised 9 September 2014

DOI:https://doi.org/10.1103/PhysRevC.90.055501

©2014 American Physical Society

Authors & Affiliations

M. F. Kidd*, J. H. Esterline, S. W. Finch, and W. Tornow

  • Department of Physics, Duke University, Durham, North Carolina 27708, USA and Triangle Universities Nuclear Laboratory, Durham, North Carolina 27708, USA

  • *Now at Tennessee Technological University, PO Box 5051, Cookeville, TN 38505; mkidd@tntech.edu

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Issue

Vol. 90, Iss. 5 — November 2014

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