Abstract
The half-life of the rare β decay of In (9/2+) to Sn (3/2+) was determined by measuring the subsequent 497.334(22) keV γ-ray emission in a high-purity indium sample. The measurements were carried out by means of ultralow-level γ-ray spectrometry in the HADES underground laboratory, using three different high-purity germanium detectors. The value of the partial half-life for this low- transition was measured to be 4.3(5) × 10 yr.
- Received 13 December 2010
DOI:https://doi.org/10.1103/PhysRevC.84.044605
©2011 American Physical Society