Half-life of the electron-capture decay of Ru97: Precision measurement shows no temperature dependence

J. R. Goodwin, V. V. Golovko, V. E. Iacob, and J. C. Hardy
Phys. Rev. C 80, 045501 – Published 16 October 2009

Abstract

We have measured the half-life of the electron-capture (ec) decay of Ru97 in a metallic environment, both at low temperature (19K), and also at room temperature. We find the half-lives at both temperatures to be the same within 0.1%. This demonstrates that a recent claim that the ec decay half-life for Be7 changes by 0.9%±0.2% under similar circumstances certainly cannot be generalized to other ec decays. Our results for the half-life of Ru97, 2.8370(14) d at room temperature and 2.8382(14) d at 19 K, are consistent with, but much more precise than, previous room-temperature measurements. In addition, we have also measured the half-lives of the β-emitters Ru103 and Rh105 at both temperatures, and found them also to be unchanged.

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  • Received 27 August 2009

DOI:https://doi.org/10.1103/PhysRevC.80.045501

©2009 American Physical Society

Authors & Affiliations

J. R. Goodwin, V. V. Golovko*, V. E. Iacob, and J. C. Hardy

  • Cyclotron Institute, Texas A&M University, College Station, Texas 77843, USA

  • *Present address: Department of Physics, Queen’s University, Stirling Hall, Kingston, ON, Canada K7L3N6.
  • hardy@comp.tamu.edu

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Vol. 80, Iss. 4 — October 2009

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