• Open Access

Strong randomness criticality in the scratched XY model

Tobias Pfeffer, Zhiyuan Yao, and Lode Pollet
Phys. Rev. B 99, 104514 – Published 19 March 2019

Abstract

We study the finite-temperature superfluid transition in a modified two-dimensional (2D) XY model with power-law-distributed “scratch”-like bond disorder. As its exponent decreases, the disorder grows stronger and the mechanism driving the superfluid transition changes from conventional vortex-pair unbinding to a strong randomness criticality (termed scratched XY criticality) characterized by a nonuniversal jump of the superfluid stiffness. The existence of the scratched XY criticality at finite temperature and its description by an asymptotically exact semi-renormalization group theory, previously developed for the superfluid-insulator transition in one-dimensional disordered quantum systems, is numerically proven by designing a model with minimal finite-size effects. Possible experimental implementations are discussed.

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  • Received 31 July 2018
  • Revised 19 February 2019

DOI:https://doi.org/10.1103/PhysRevB.99.104514

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied PhysicsGeneral Physics

Authors & Affiliations

Tobias Pfeffer

  • Department of Physics, Arnold Sommerfeld Center for Theoretical Physics, University of Munich, Theresienstrasse 37, 80333 Munich, Germany

Zhiyuan Yao

  • Department of Physics, University of Massachusetts, Amherst, Massachusetts 01003, USA, and Institute for Advanced Study, Tsinghua University, Beijing 100084, China

Lode Pollet

  • Department of Physics, Arnold Sommerfeld Center for Theoretical Physics, University of Munich, Theresienstrasse 37, 80333 Munich, Germany

Article Text

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Issue

Vol. 99, Iss. 10 — 1 March 2019

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