Abstract
Element doping and pressure compression may change material properties for improved performance in applications. We report pressure-induced metallization in the semiconductor . Transport measurements showed an overall resistivity drop of 11 orders of magnitude under compression up to 12 GPa, which is indicative of a metallization transition. X-ray diffraction measurements revealed that the sample underwent a structural transition from a cubic- phase (zinc blende) to a cubic- phase (rock salt) at about 5.5 GPa, followed by another transition to an orthorhombic structure at 13 GPa. A huge volume collapse of about 18% was observed during the first phase transition, suggesting a first-order phase transition. The disappearance or weakening of Raman modes, temperature-dependent resistivity, and calculation results depict the metallic nature of both the rock-salt and phases. The band structure changes and increased carrier density (especially at the first structural transition) are likely a consequence of the structural transition.
- Received 25 December 2018
- Revised 6 February 2019
DOI:https://doi.org/10.1103/PhysRevB.99.094109
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