Defects and oxidation resilience in InSe

K. J. Xiao, A. Carvalho, and A. H. Castro Neto
Phys. Rev. B 96, 054112 – Published 17 August 2017

Abstract

We use density functional theory to study intrinsic defects and oxygen related defects in indium selenide. We find that InSe is prone to oxidation, but however not reacting with oxygen as strongly as phosphorene. The dominant intrinsic defects in In-rich material are the In interstitial, a shallow donor, and the Se vacancy, which introduces deep traps. The latter can be passivated by oxygen, which is isoelectronic with Se. The dominant intrinsic defects in Se-rich material have comparatively higher formation energies.

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  • Received 24 May 2017

DOI:https://doi.org/10.1103/PhysRevB.96.054112

©2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

K. J. Xiao1,*, A. Carvalho1,†, and A. H. Castro Neto1,2

  • 1Centre for Advanced 2D Materials and Graphene Research Centre, National University of Singapore, Singapore 117542, Singapore
  • 2Boston University, 590 Commonwealth Avenue, Boston, Massachusetts 02215, USA

  • *c2dxk@nus.edu.sg
  • carvalho@nus.edu.sg

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Issue

Vol. 96, Iss. 5 — 1 August 2017

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