Disentangling specific versus generic doping mechanisms in oxide heterointerfaces

J. Gabel, M. Zapf, P. Scheiderer, P. Schütz, L. Dudy, M. Stübinger, C. Schlueter, T.-L. Lee, M. Sing, and R. Claessen
Phys. Rev. B 95, 195109 – Published 5 May 2017

Abstract

More than a decade after the discovery of the two-dimensional electron system (2DES) at the interface between the band insulators LaAlO3 (LAO) and SrTiO3 (STO) its microscopic origin is still under debate. Several explanations have been proposed, the main contenders being electron doping by oxygen vacancies and electronic reconstruction, i.e., the redistribution of electrons to the interface to minimize the electrostatic energy in the polar LAO film. However, no experiment thus far could provide unambiguous information on the microscopic origin of the interfacial charge carriers. Here we utilize a novel experimental approach combining photoelectron spectroscopy (PES) with highly brilliant synchrotron radiation and apply it to a set of samples with varying key parameters that are thought to be crucial for the emergence of interfacial conductivity. Based on microscopic insight into the electronic structure, we obtain results tipping the scales in favor of polar discontinuity as a generic, robust driving force for the 2DES formation. Likewise, other functionalities such as magnetism or superconductivity might be switched in all-oxide devices by polarity-driven charge transfer.

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  • Received 16 September 2016
  • Revised 22 December 2016

DOI:https://doi.org/10.1103/PhysRevB.95.195109

©2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

J. Gabel1, M. Zapf1, P. Scheiderer1, P. Schütz1, L. Dudy1, M. Stübinger1, C. Schlueter2, T.-L. Lee2, M. Sing1, and R. Claessen1

  • 1Physikalisches Institut and Röntgen Center for Complex Material Systems (RCCM), Universität Würzburg, Am Hubland, D-97074 Würzburg, Germany
  • 2Diamond Light Source Ltd., Didcot, Oxfordshire OX11 0DE, United Kingdom

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Issue

Vol. 95, Iss. 19 — 15 May 2017

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