Abstract
Electron paramagnetic resonance (EPR) signatures, more specifically the elements of the electronic tensor, are calculated within density functional theory for hydrogenated Si(111), Si(001), Si(113), Si(114), , and Si(110) surfaces. Thereby both perturbation theory and a more sophisticated Berry phase technique are applied. Specific defects on different surface orientations are shown to reproduce the resonances at and measured for hydrogenated microcrystalline silicon: The latter value is argued here to originate from regions with low hydrogen coverage; the resonance at is shown to appear in positions with dihydride environment, where an H atom is directly bound to the silicon dangling-bond atoms. A third group of EPR signals with considerably larger values between 2.006 and 2.009 is predicted for highly symmetric dangling bonds resembling single dangling-bond defects in silicon bulk material. As the exact value depends strongly on local strain, this type of defect can explain a less intense signal with large strain observed in microcrystalline as well as in amorphous material.
5 More- Received 10 January 2017
DOI:https://doi.org/10.1103/PhysRevB.95.125310
©2017 American Physical Society