Electron paramagnetic resonance calculations for hydrogenated Si surfaces

M. Rohrmüller, W. G. Schmidt, and U. Gerstmann
Phys. Rev. B 95, 125310 – Published 17 March 2017

Abstract

Electron paramagnetic resonance (EPR) signatures, more specifically the elements of the electronic g tensor, are calculated within density functional theory for hydrogenated Si(111), Si(001), Si(113), Si(114), Si(112¯), and Si(110) surfaces. Thereby both perturbation theory and a more sophisticated Berry phase technique are applied. Specific defects on different surface orientations are shown to reproduce the resonances at g¯=2.0043 and g¯=2.0052 measured for hydrogenated microcrystalline silicon: The latter value is argued here to originate from regions with low hydrogen coverage; the resonance at g¯=2.0043 is shown to appear in positions with dihydride environment, where an H atom is directly bound to the silicon dangling-bond atoms. A third group of EPR signals with considerably larger g¯ values between 2.006 and 2.009 is predicted for highly symmetric dangling bonds resembling single dangling-bond defects in silicon bulk material. As the exact value depends strongly on local strain, this type of defect can explain a less intense signal with large g strain observed in microcrystalline as well as in amorphous material.

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  • Received 10 January 2017

DOI:https://doi.org/10.1103/PhysRevB.95.125310

©2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

M. Rohrmüller*, W. G. Schmidt, and U. Gerstmann

  • Lehrstuhl für Theoretische Materialphysik, Universität Paderborn, 33095 Paderborn, Germany

  • *rohry@phys.uni-paderborn.de

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Issue

Vol. 95, Iss. 12 — 15 March 2017

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