Infrared spectroscopic study of carrier scattering in gated CVD graphene

Kwangnam Yu, Jiho Kim, Joo Youn Kim, Wonki Lee, Jun Yeon Hwang, E. H. Hwang, and E. J. Choi
Phys. Rev. B 94, 235404 – Published 2 December 2016
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Abstract

We measured Drude absorption of gated CVD graphene using far-infrared transmission spectroscopy and determined the carrier scattering rate (γ) as a function of the varied carrier density (n). The n-dependent γ(n) was obtained for a series of conditions systematically changed as (10 K, vacuum) (300 K, vacuum) (300 K, ambient pressure), which reveals that (1) at low-T, charged impurity (=A/n) and short-range defect (=Bn) are the major scattering sources which constitute the total scattering γ=A/n+Bn, (2) among various kinds of phonons populated at room-T, surface polar phonon of the SiO2 substrate is the dominantly scattering source, and (3) in air, the gas molecules adsorbed on graphene play a dual role in carrier scattering as charged impurity center and resonant scattering center. We present the absolute scattering strengths of those individual scattering sources, which provides the complete map of scattering mechanism of CVD graphene. This scattering map allows us to find out practical measures to suppress the individual scatterings, the mobility gains accompanied by them, and finally the ultimate attainable carrier mobility for CVD graphene.

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  • Received 17 August 2016
  • Revised 11 October 2016

DOI:https://doi.org/10.1103/PhysRevB.94.235404

©2016 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Kwangnam Yu1, Jiho Kim1, Joo Youn Kim1, Wonki Lee2, Jun Yeon Hwang2, E. H. Hwang3, and E. J. Choi1,*

  • 1Department of Physics, University of Seoul, Seoul 130-743, Korea
  • 2Institute of Advanced Composites Materials, Korea Institute of Science and Technology (KIST), Wanju 55324, Korea
  • 3SKKU Advanced Institute of Nanotechnology and Department of Physics, Sungkyunkwan University, Suwon 16419, Korea

  • *Corresponding author: echoi@uos.ac.kr

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Issue

Vol. 94, Iss. 23 — 15 December 2016

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