Nanoscale imaging of magnetization reversal driven by spin-orbit torque

Ian Gilbert, P. J. Chen, Daniel B. Gopman, Andrew L. Balk, Daniel T. Pierce, Mark D. Stiles, and John Unguris
Phys. Rev. B 94, 094429 – Published 23 September 2016
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Abstract

We use scanning electron microscopy with polarization analysis to image deterministic, spin-orbit torque-driven magnetization reversal of in-plane magnetized CoFeB rectangles in zero applied magnetic field. The spin-orbit torque is generated by running a current through heavy metal microstrips, either Pt or Ta, upon which the CoFeB rectangles are deposited. We image the CoFeB magnetization before and after a current pulse to see the effect of spin-orbit torque on the magnetic nanostructure. The observed changes in magnetic structure can be complex, deviating significantly from a simple macrospin approximation, especially in larger elements. Overall, however, the directions of the magnetization reversal in the Pt and Ta devices are opposite, consistent with the opposite signs of the spin Hall angles of these materials. Our results elucidate the effects of current density, geometry, and magnetic domain structure on magnetization switching driven by spin-orbit torque.

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  • Received 13 June 2016
  • Revised 6 September 2016

DOI:https://doi.org/10.1103/PhysRevB.94.094429

©2016 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Ian Gilbert1,*, P. J. Chen2, Daniel B. Gopman2, Andrew L. Balk1,3,4, Daniel T. Pierce1, Mark D. Stiles1, and John Unguris1

  • 1Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
  • 2Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
  • 3Maryland NanoCenter, University of Maryland, College Park, Maryland 20742, USA
  • 4National High Magnetic Field Laboratory, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA

  • *ian.gilbert@nist.gov

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Issue

Vol. 94, Iss. 9 — 1 September 2016

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