Thickness and electric-field-dependent polarizability and dielectric constant in phosphorene

Piyush Kumar, B. S. Bhadoria, Sanjay Kumar, Somnath Bhowmick, Yogesh Singh Chauhan, and Amit Agarwal
Phys. Rev. B 93, 195428 – Published 19 May 2016

Abstract

Based on extensive first-principles calculations, we explore the thickness-dependent effective dielectric constant and slab polarizability of few-layer black phosphorene. We find that the dielectric constant in ultrathin phosphorene is thickness-dependent and it can be further tuned by applying an out-of-plane electric field. The decreasing dielectric constant with reducing number of layers of phosphorene is a direct consequence of the lower permittivity of the outer layers and the increasing surface-to-volume ratio. We also show that the slab polarizability depends linearly on the number of layers, implying a nearly constant polarizability per phosphorus atom. Our calculation of the thickness- and electric-field-dependent dielectric properties will be useful for designing and interpreting transport experiments in gated phosphorene devices, wherever electrostatic effects such as capacitance and charge screening are important.

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  • Received 3 March 2016
  • Revised 15 April 2016

DOI:https://doi.org/10.1103/PhysRevB.93.195428

©2016 American Physical Society

Authors & Affiliations

Piyush Kumar1, B. S. Bhadoria2, Sanjay Kumar3, Somnath Bhowmick4, Yogesh Singh Chauhan1, and Amit Agarwal3,*

  • 1Department of Electrical Engineering, Indian Institute of Technology Kanpur, Kanpur 208016, India
  • 2Department of Physics, Bundelkhand University, Jhansi 284128, India
  • 3Department of Physics, Indian Institute of Technology Kanpur, Kanpur 208016, India
  • 4Department of Materials Science and Engineering, Indian Institute of Technology Kanpur, Kanpur 208016, India

  • *Corresponding author: amitag@iitk.ac.in

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Vol. 93, Iss. 19 — 15 May 2016

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