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Spin-flip noise due to nonequilibrium spin accumulation

Liang Liu (刘亮), Jiasen Niu (牛佳森), Huiqiang Guo (郭会强), Jian Wei (危健), D. L. Li, J. F. Feng, X. F. Han, J. M. D. Coey, and X.-G. Zhang
Phys. Rev. B 93, 180401(R) – Published 3 May 2016
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Abstract

When current flows through a magnetic tunnel junction (MTJ), there is spin accumulation at the electrode-barrier interfaces if the magnetic moments of the two ferromagnetic electrodes are not aligned. Here we report that such nonequilibrium spin accumulation generates its own characteristic low frequency noise (LFN). Past work viewed the LFN in MTJs as an equilibrium effect arising from resistance fluctuations (SR) which a passively applied current (I) converts to measurable voltage fluctuations (SV=I2SR). We treat the LFN associated with spin accumulation as a nonequilibrium effect, and find that the noise power can be fitted in terms of the spin-polarized current by SIf=aIcothIbab, resembling the form of the shot noise for a tunnel junction, but with current now taking the role of the bias voltage, and spin-flip probability taking the role of tunneling probability.

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  • Received 23 December 2015
  • Revised 19 April 2016

DOI:https://doi.org/10.1103/PhysRevB.93.180401

©2016 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Liang Liu (刘亮), Jiasen Niu (牛佳森), Huiqiang Guo (郭会强), and Jian Wei (危健)*

  • International Center for Quantum Materials, School of Physics, Peking University, Beijing 100871, China and Collaborative Innovation Center of Quantum Matter, Beijing, China

D. L. Li, J. F. Feng, and X. F. Han

  • Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

J. M. D. Coey

  • CRANN and School of Physics, Trinity College, Dublin 2, Ireland

X.-G. Zhang

  • Department of Physics and the Quantum Theory Project, University of Florida, Gainesville, Florida 32611, USA

  • *weijian6791@pku.edu.cn
  • jiafengfeng@iphy.ac.cn
  • xgz@ufl.edu

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Issue

Vol. 93, Iss. 18 — 1 May 2016

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