Probing core-electron orbitals by scanning transmission electron microscopy and measuring the delocalization of core-level excitations

Jong Seok Jeong, Michael L. Odlyzko, Peng Xu, Bharat Jalan, and K. Andre Mkhoyan
Phys. Rev. B 93, 165140 – Published 26 April 2016
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Abstract

By recording low-noise energy-dispersive x-ray spectroscopy maps from crystalline specimens using aberration-corrected scanning transmission electron microscopy, it is possible to probe core-level electron orbitals in real space. Both the 1s and 2p orbitals of Sr and Ti atoms in SrTiO3 are probed, and their projected excitation potentials are determined. This paper also demonstrates experimental measurement of the electronic excitation impact parameter and the delocalization of an excitation due to Coulombic beam-orbital interaction.

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  • Received 17 August 2015
  • Revised 6 April 2016

DOI:https://doi.org/10.1103/PhysRevB.93.165140

©2016 American Physical Society

Authors & Affiliations

Jong Seok Jeong*, Michael L. Odlyzko, Peng Xu, Bharat Jalan, and K. Andre Mkhoyan

  • Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455, USA

  • *Corresponding author: jsjeong@umn.edu
  • Corresponding author: mkhoyan@umn.edu

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Issue

Vol. 93, Iss. 16 — 15 April 2016

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