Abstract
We directly measure the electronic structure of twisted graphene/ van der Waals heterostructures, in which both graphene and are monolayers. We use cathode lens microscopy and microprobe angle-resolved photoemission spectroscopy measurements to image the surface, determine twist angle, and map the electronic structure of these artificial heterostructures. For monolayer graphene on monolayer , the resulting band structure reveals the absence of hybridization between the graphene and electronic states. Further, the graphene-derived electronic structure in the heterostructures remains essentially intact, irrespective of the twist angle between the two materials. In contrast, however, the electronic structure associated with the layer is found to be twist-angle dependent; in particular, the relative difference in the energy of the valence band maximum at and of the layer varies from approximately 0 to 0.2 eV. Our results suggest that monolayer within the heterostructure becomes predominantly an indirect band-gap system for all twist angles except in the proximity of . This result enables potential band-gap engineering in van der Waals heterostructures comprised of monolayer structures.
- Received 1 July 2015
DOI:https://doi.org/10.1103/PhysRevB.92.201409
©2015 American Physical Society