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Reflection thermal diffuse x-ray scattering for quantitative determination of phonon dispersion relations

A. B. Mei, O. Hellman, C. M. Schlepütz, A. Rockett, T.-C. Chiang, L. Hultman, I. Petrov, and J. E. Greene
Phys. Rev. B 92, 174301 – Published 3 November 2015

Abstract

Synchrotron reflection x-ray thermal diffuse scattering (TDS) measurements, rather than previously reported transmission TDS, are carried out at room temperature and analyzed using a formalism based upon second-order interatomic force constants and long-range Coulomb interactions to obtain quantitative determinations of MgO phonon dispersion relations ωj(q), phonon densities of states g(ω), and isochoric temperature-dependent vibrational heat capacities cv(T). We use MgO as a model system for investigating reflection TDS due to its harmonic behavior as well as its mechanical and dynamic stability. Resulting phonon dispersion relations and densities of states are found to be in good agreement with independent reports from inelastic neutron and x-ray scattering experiments. Temperature-dependent isochoric heat capacities cv(T), computed within the harmonic approximation from ωj(q) values, increase with temperature from 0.4×104eV/atomK at 100 K to 1.4×104eV/atomK at 200 K and 1.9×104eV/atomK at 300 K, in excellent agreement with isobaric heat capacity values cp(T) between 4 and 300 K. We anticipate that the experimental approach developed here will be valuable for determining vibrational properties of heteroepitaxial thin films since the use of grazing-incidence (θθc, where θc is the density-dependent critical angle) allows selective tuning of x-ray penetration depths to 10nm.

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  • Received 24 August 2015
  • Revised 1 October 2015

DOI:https://doi.org/10.1103/PhysRevB.92.174301

©2015 American Physical Society

Authors & Affiliations

A. B. Mei1, O. Hellman2, C. M. Schlepütz3,4, A. Rockett1, T.-C. Chiang5, L. Hultman6, I. Petrov1,6, and J. E. Greene1,6

  • 1Department of Materials Science and the Materials Research Laboratory, University of Illinois, 104 South Goodwin, Urbana, Illinois 61801, USA
  • 2Department of Applied Physics and Materials Science, California Institute of Technology, Pasadena, California 91125, USA
  • 3X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439, USA
  • 4Swiss Light Source, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
  • 5Department of Physics and the Materials Research Laboratory, University of Illinois, 1110 West Green Street, Urbana, Illinois 61801, USA
  • 6Thin Film Physics Division, Department of Physics (IFM), Linköping University, SE-58183 Linköping, Sweden

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Issue

Vol. 92, Iss. 17 — 1 November 2015

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