Low-temperature 1/f noise in microwave dielectric constant of amorphous dielectrics in Josephson qubits

Alexander L. Burin, Shlomi Matityahu, and Moshe Schechter
Phys. Rev. B 92, 174201 – Published 16 November 2015

Abstract

The analytical solution for the low-temperature 1/f noise in the microwave dielectric constant of amorphous films at frequency ν05GHz due to tunneling two-level systems (TLSs) is derived within the standard tunneling model including the weak dipolar or elastic TLS-TLS interactions. The 1/f frequency dependence is caused by TLS spectral diffusion characterized by the width growing logarithmically with time. Temperature and field dependencies are predicted for the noise spectral density in typical glasses with universal TLSs. The satisfactory interpretation of the recent experiment by J. Burnett et al. [Nat. Commun. 5, 4119 (2014)] in Pt-capped Nb superconducting resonators is attained by assuming a smaller density of TLSs compared to ordinary glasses, which is consistent with the very high internal quality factor in those samples.

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  • Received 15 March 2015

DOI:https://doi.org/10.1103/PhysRevB.92.174201

©2015 American Physical Society

Authors & Affiliations

Alexander L. Burin

  • Department of Chemistry, Tulane University, New Orleans, Louisiana 70118, USA

Shlomi Matityahu and Moshe Schechter

  • Department of Physics, Ben-Gurion University of the Negev, Beer Sheva 84105, Israel

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Issue

Vol. 92, Iss. 17 — 1 November 2015

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