Abstract
The In/Si(111) system reveals an anisotropy in the electrical conductivity and is a prototype system for atomic wires on surfaces. We use this system to study and tune the interwire interaction by adsorption of oxygen. Through rotational square four-tip transport measurements, both the parallel and perpendicular components are measured separately. The analysis of the I(V) curves reveals that is also affected by adsorption of oxygen, showing clearly an effective interwire coupling, in agreement with density-functional-theory-based calculations of the transmittance. In addition to these surface-state mediated transport channels, we confirm the existence of conducting parasitic space-charge layer channels and address the importance of substrate steps by performing the transport measurements of In phases grown on Si(111) mesa structures.
- Received 29 May 2015
- Revised 10 July 2015
DOI:https://doi.org/10.1103/PhysRevB.92.085426
©2015 American Physical Society