Diffusion of point defects in crystalline silicon using the kinetic activation-relaxation technique method

Mickaël Trochet, Laurent Karim Béland, Jean-François Joly, Peter Brommer, and Normand Mousseau
Phys. Rev. B 91, 224106 – Published 16 June 2015
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Abstract

We study point-defect diffusion in crystalline silicon using the kinetic activation-relaxation technique (k-ART), an off-lattice kinetic Monte Carlo method with on-the-fly catalog building capabilities based on the activation-relaxation technique (ART nouveau), coupled to the standard Stillinger-Weber potential. We focus more particularly on the evolution of crystalline cells with one to four vacancies and one to four interstitials in order to provide a detailed picture of both the atomistic diffusion mechanisms and overall kinetics. We show formation energies, activation barriers for the ground state of all eight systems, and migration barriers for those systems that diffuse. Additionally, we characterize diffusion paths and special configurations such as dumbbell complex, di-interstitial (IV-pair+2I) superdiffuser, tetrahedral vacancy complex, and more. This study points to an unsuspected dynamical richness even for this apparently simple system that can only be uncovered by exhaustive and systematic approaches such as the kinetic activation-relaxation technique.

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  • Received 12 March 2015

DOI:https://doi.org/10.1103/PhysRevB.91.224106

©2015 American Physical Society

Authors & Affiliations

Mickaël Trochet1,*, Laurent Karim Béland2,†, Jean-François Joly3,‡, Peter Brommer4,§, and Normand Mousseau1,∥

  • 1Département de Physique and Regroupement Québécois sur les Matériaux de Pointe (RQMP), Université de Montréal, C.P. 6128, Succursale Centre-Ville, Montréal, Québec, Canada H3C 3J7
  • 2Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6138, USA
  • 3Department of Mechanical and Aerospace Engineering, Carleton University, 1125 Colonel By Drive, Ottawa, Ontario, Canada K1S 5B6
  • 4Warwick Centre for Predictive Modelling, School of Engineering, and Centre for Scientific Computing, University of Warwick, Library Road, Coventry CV4 7AL, UK

  • *mickael.laurent.trochet@umontreal.ca
  • belandlk@ornl.gov
  • jeanfrancois.joly@carleton.ca
  • §p.brommer@warwick.ac.uk
  • normand.mousseau@umontreal.ca

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Issue

Vol. 91, Iss. 22 — 1 June 2015

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