Abstract
Doping the (LAO) side of the interface with 2% Tm or Lu does not significantly affect its electron transport. Also, at low temperatures, carrier mobility is steeply anticorrelated with carrier concentration for both doped and undoped interfaces. This relationship cannot be explained by ionized impurities alone but may be driven by positive charge in or on the LAO film.
- Received 6 December 2014
- Revised 27 April 2015
DOI:https://doi.org/10.1103/PhysRevB.91.205112
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